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Advantage of in-situ over ex-situ techniques as reliability tool: aging kinetics of IMEC's MCM-D discrete passives devices

dc.contributor.authorSoussan, Philippe
dc.contributor.authorLekens, Geert
dc.contributor.authorDreesen, R.
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorBeyne, Eric
dc.date.accessioned2021-10-15T06:48:26Z
dc.date.available2021-10-15T06:48:26Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8176
dc.sourceIIOimport
dc.titleAdvantage of in-situ over ex-situ techniques as reliability tool: aging kinetics of IMEC's MCM-D discrete passives devices
dc.typeJournal article
dc.contributor.imecauthorSoussan, Philippe
dc.contributor.imecauthorLekens, Geert
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecSoussan, Philippe::0000-0002-1347-6978
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.source.peerreviewno
dc.source.beginpage1785
dc.source.endpage1790
dc.source.journalMicroelectronics Reliability
dc.source.issue9_11
dc.source.volume43
imec.availabilityPublished - imec
imec.internalnotesPaper from the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis; Bordeaux, October 2003


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