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Impact of technology scaling on the input and output features of RF MOSFETs: effects and modelling

dc.contributor.authorTorres-Torres, Reydezel
dc.contributor.authorMurphy-Arteaga, Roberto
dc.contributor.authorAugendre, Emmanuel
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-15T07:00:26Z
dc.date.available2021-10-15T07:00:26Z
dc.date.issued2003-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8222
dc.sourceIIOimport
dc.titleImpact of technology scaling on the input and output features of RF MOSFETs: effects and modelling
dc.typeProceedings paper
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage295
dc.source.endpage298
dc.source.conference33rd European Solid-State Devices Research Conference - ESSDERC
dc.source.conferencedate16/09/2003
dc.source.conferencelocationEstoril Portugal
imec.availabilityPublished - imec


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