dc.contributor.author | Ulyashin, A.G. | |
dc.contributor.author | Scherff, M. | |
dc.contributor.author | Job, R. | |
dc.contributor.author | Fahrner, W.R. | |
dc.contributor.author | Bilyalov, Renat | |
dc.contributor.author | Poortmans, Jef | |
dc.contributor.author | Abrosimov, N. | |
dc.contributor.author | Riemann, H. | |
dc.date.accessioned | 2021-10-15T07:04:59Z | |
dc.date.available | 2021-10-15T07:04:59Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8239 | |
dc.source | IIOimport | |
dc.title | Modification of the effective minority carrier lifetime of silicon substrates by heat treatment and/or hydrogenation | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.source.peerreview | no | |
dc.source.conference | 10th Int. Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology - GADEST | |
dc.source.conferencedate | 21/09/2003 | |
dc.source.conferencelocation | Berlin Germany | |
imec.availability | Published - imec | |