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Conference contributions
Results of a high density flip chip on flex reliability test program
Publication:
Results of a high density flip chip on flex reliability test program
Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandecasteele, Bjorn
;
Vanfleteren, Jan
;
Määttänen, Jarmo
;
Laitinen, Tanja
;
de Maquillé, Yannick
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1886
since deposited on 2021-10-15
Acq. date: 2025-10-27
Citations
Metrics
Views
1886
since deposited on 2021-10-15
Acq. date: 2025-10-27
Citations