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Quantitative 2D-carrier profiling in semiconductors with sub-nm spatial resolution using SSRM
Publication:
Quantitative 2D-carrier profiling in semiconductors with sub-nm spatial resolution using SSRM
Date
2003
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Eyben, Pierre
;
Duhayon, Natasja
;
Alvarez, David
;
Fouchier, Marc
;
Xu, Mingwei
Journal
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1957
since deposited on 2021-10-15
436
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1957
since deposited on 2021-10-15
436
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations