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High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices

dc.contributor.authorVassilev, Vesselin
dc.contributor.authorJenei, Snezana
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorVenegas, Rafael
dc.contributor.authorThijs, Steven
dc.contributor.authorDe Heyn, Vincent
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorSteyaert, M.
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-15T07:34:12Z
dc.date.available2021-10-15T07:34:12Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8349
dc.sourceIIOimport
dc.titleHigh frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorDe Heyn, Vincent
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1011
dc.source.endpage1020
dc.source.journalMicroelectronics Reliability
dc.source.issue7
dc.source.volume43
imec.availabilityPublished - open access


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