Authors

Vassilev, Vesselin; Jenei, Snezana; Groeseneken, Guido; Venegas, Rafael; Thijs, Steven; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Steyaert, M.; Maes, Herman

Issue

7

Journal

Microelectronics Reliability

Volume

43

Title

High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices

Publication type

Journal article

Embargo date

9999-12-31