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High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices

Date

2003
Journal article
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dc.contributor.authorVassilev, Vesselin
dc.contributor.authorJenei, Snezana
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorVenegas, Rafael
dc.contributor.authorThijs, Steven
dc.contributor.authorDe Heyn, Vincent
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorSteyaert, M.
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorDe Heyn, Vincent
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.date.accessioned2021-10-15T07:34:12Z
dc.date.available2021-10-15T07:34:12Z
dc.date.embargo9999-12-31
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8349
dc.source.beginpage1011
dc.source.endpage1020
dc.source.issue7
dc.source.journalMicroelectronics Reliability
dc.source.volume43
dc.title

High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices

dc.typeJournal article
dspace.entity.typePublication
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