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Co-design methodology to provide high esd protection levels in the advanced rf circuits

dc.contributor.authorVassilev, Vesselin
dc.contributor.authorThijs, Steven
dc.contributor.authorLajo-Segura, P.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorWambacq, Piet
dc.contributor.authorLeroux, P.
dc.contributor.authorSteyaert, M.
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-15T07:34:50Z
dc.date.available2021-10-15T07:34:50Z
dc.date.issued2003-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8351
dc.sourceIIOimport
dc.titleCo-design methodology to provide high esd protection levels in the advanced rf circuits
dc.typeProceedings paper
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorWambacq, Piet
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.source.peerreviewyes
dc.source.beginpage195
dc.source.endpage203
dc.source.conferenceProceedings EOS/ESD Symposium
dc.source.conferencedate21/09/2003
dc.source.conferencelocationLas Vegas USA
imec.availabilityPublished - imec


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