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Resolving line collapse in 193nm lithography with surfactinated post develop rinse solutions
Publication:
Resolving line collapse in 193nm lithography with surfactinated post develop rinse solutions
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Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Versluijs, Janko
;
Misat, Sylvain Irénée
;
Maenhoudt, Mireille
;
Grozev, Grozdan
;
Furusho, Tetsunari
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1948
since deposited on 2021-10-15
Acq. date: 2025-12-18
Citations
Metrics
Views
1948
since deposited on 2021-10-15
Acq. date: 2025-12-18
Citations