Correlation between solvent diffusion, porosity and pore sealing for low k dielectrics
dc.contributor.author | Abell, Thomas | |
dc.contributor.author | Shamiryan, Denis | |
dc.contributor.author | Patz, Matthias | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-15T12:38:35Z | |
dc.date.available | 2021-10-15T12:38:35Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8456 | |
dc.source | IIOimport | |
dc.title | Correlation between solvent diffusion, porosity and pore sealing for low k dielectrics | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Maex, Karen | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 549 | |
dc.source.endpage | 553 | |
dc.source.conference | Advanced Metallization Conference 2003 | |
dc.source.conferencedate | 21/10/2003 | |
dc.source.conferencelocation | Montreal/Tokyo | |
imec.availability | Published - open access | |
imec.internalnotes | Conference Proceedings AMC XIX |