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Band alignment between (100)Si and complex rare-earth/transition metal oxides

dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorStesmans, Andre
dc.contributor.authorZhao, Chao
dc.contributor.authorCaymax, Matty
dc.contributor.authorHeeg,
dc.contributor.authorSchubert,
dc.contributor.authorJia, Y.
dc.contributor.authorSchlom, D.
dc.contributor.authorLucovsky, G.
dc.date.accessioned2021-10-15T12:38:44Z
dc.date.available2021-10-15T12:38:44Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8467
dc.sourceIIOimport
dc.titleBand alignment between (100)Si and complex rare-earth/transition metal oxides
dc.typeOral presentation
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorStesmans, Andre
dc.contributor.imecauthorCaymax, Matty
dc.source.peerreviewno
dc.source.conference35th IEEE Semiconductor Interface Specialists Conference
dc.source.conferencedate9/12/2004
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec


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