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Evidence for source-side injection hot carrier effects on lateral DMOS transistors

dc.contributor.authorAresu, S.
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMoens, P.
dc.contributor.authorManca, Jean
dc.contributor.authorWojciechowski, D.
dc.contributor.authorGassot, P.
dc.date.accessioned2021-10-15T12:39:01Z
dc.date.available2021-10-15T12:39:01Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8481
dc.sourceIIOimport
dc.titleEvidence for source-side injection hot carrier effects on lateral DMOS transistors
dc.typeProceedings paper
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecDe Ceuninck, Ward::0000-0002-4630-5569
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.source.peerreviewno
dc.source.beginpage1621
dc.source.endpage1624
dc.source.conferenceProceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF
dc.source.conferencedate4/10/2004
dc.source.conferencelocationZürich Switzerland
imec.availabilityPublished - imec
imec.internalnotesBest paper award


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