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Impact of technology scaling on substrate noise generation mechanisms

dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorWambacq, Piet
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorDonnay, Stephane
dc.contributor.authorGielen, Georges
dc.contributor.authorDe Man, Hugo
dc.date.accessioned2021-10-15T12:39:47Z
dc.date.available2021-10-15T12:39:47Z
dc.date.issued2004-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8508
dc.sourceIIOimport
dc.titleImpact of technology scaling on substrate noise generation mechanisms
dc.typeProceedings paper
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.beginpage501
dc.source.endpage504
dc.source.conferenceProceedings IEEE Custom Integrated Circuits Conference - CICC
dc.source.conferencedate3/10/2004
dc.source.conferencelocationOrlando, FL USA
imec.availabilityPublished - imec


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