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Automated generation of intrinsic large-signal HEMT models from S-parameter measurements

dc.contributor.authorSchreurs, Dominique
dc.contributor.authorBaeyens, S.
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorVan Rossum, Marc
dc.date.accessioned2021-09-29T13:16:13Z
dc.date.available2021-09-29T13:16:13Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/856
dc.sourceIIOimport
dc.titleAutomated generation of intrinsic large-signal HEMT models from S-parameter measurements
dc.typeProceedings paper
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorDe Raedt, Walter
dc.source.peerreviewno
dc.source.beginpage106
dc.source.endpage110
dc.source.conferenceProceedings Microwave and Optronics Conference; May 30 - June 1, 1995; Sindelfingen, Germany.
dc.source.conferencelocation
imec.availabilityPublished - imec


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