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How total internal reflection can make electronic paper better

dc.contributor.authorBert, Tom
dc.contributor.authorDe Smet, Herbert
dc.date.accessioned2021-10-15T12:42:59Z
dc.date.available2021-10-15T12:42:59Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8572
dc.sourceIIOimport
dc.titleHow total internal reflection can make electronic paper better
dc.typeProceedings paper
dc.contributor.imecauthorDe Smet, Herbert
dc.source.peerreviewno
dc.source.beginpage84
dc.source.endpage86
dc.source.conferenceAmericas Display Engineering and Applications Conference - ADEAC
dc.source.conferencedate25/10/2004
dc.source.conferencelocationFort Worth, TX USA
imec.availabilityPublished - imec


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