Write/erase cycling endurance of memory cells with SiO2/HfO2 tunnel dielectric

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Authors
Blomme, Pieter; Van Houdt, Jan; De Meyer, Kristin
Issue
3
Journal
IEEE Trans. Device and Materials Reliability
Volume
4
Title
Write/erase cycling endurance of memory cells with SiO2/HfO2 tunnel dielectric
Publication type
Journal article
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