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dc.contributor.authorCatthoor, Francky
dc.contributor.authorCuomo, A.
dc.contributor.authorMartin, G.
dc.contributor.authorGroeneveld, P.
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorMaex, Karen
dc.contributor.authorVan de Steeg, P.
dc.contributor.authorWilson, R.
dc.date.accessioned2021-10-15T12:50:11Z
dc.date.available2021-10-15T12:50:11Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8663
dc.sourceIIOimport
dc.titleHow can system-level design solve the interconnect technology scaling problem?
dc.typeProceedings paper
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorMaex, Karen
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.source.peerreviewno
dc.source.beginpage332
dc.source.endpage337
dc.source.conferenceProceedings of the 7th ACM/IEEE Design and Test in Europe Conference - DATE
dc.source.conferencedate10/02/2004
dc.source.conferencelocationParis France
imec.availabilityPublished - imec
imec.internalnotes


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