dc.contributor.author | Catthoor, Francky | |
dc.contributor.author | Cuomo, A. | |
dc.contributor.author | Martin, G. | |
dc.contributor.author | Groeneveld, P. | |
dc.contributor.author | Lauwereins, Rudy | |
dc.contributor.author | Maex, Karen | |
dc.contributor.author | Van de Steeg, P. | |
dc.contributor.author | Wilson, R. | |
dc.date.accessioned | 2021-10-15T12:50:11Z | |
dc.date.available | 2021-10-15T12:50:11Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8663 | |
dc.source | IIOimport | |
dc.title | How can system-level design solve the interconnect technology scaling problem? | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Catthoor, Francky | |
dc.contributor.imecauthor | Lauwereins, Rudy | |
dc.contributor.imecauthor | Maex, Karen | |
dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
dc.contributor.orcidimec | Lauwereins, Rudy::0000-0002-3861-0168 | |
dc.source.peerreview | no | |
dc.source.beginpage | 332 | |
dc.source.endpage | 337 | |
dc.source.conference | Proceedings of the 7th ACM/IEEE Design and Test in Europe Conference - DATE | |
dc.source.conferencedate | 10/02/2004 | |
dc.source.conferencelocation | Paris France | |
imec.availability | Published - imec | |
imec.internalnotes | | |