Status of NODITO project
dc.contributor.author | Sikula, J. | |
dc.contributor.author | Vasina, Petr | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-09-29T13:16:27Z | |
dc.date.available | 2021-09-29T13:16:27Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/867 | |
dc.source | IIOimport | |
dc.title | Status of NODITO project | |
dc.type | Proceedings paper | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 11 | |
dc.source.endpage | 18 | |
dc.source.conference | Noise and Reliability of Semiconductor Devices. Proceedings of the International NODITO Workshop | |
dc.source.conferencedate | 18/07/1995 | |
dc.source.conferencelocation | Brno Czech Republic | |
imec.availability | Published - open access |