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Status of NODITO project

dc.contributor.authorSikula, J.
dc.contributor.authorVasina, Petr
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T13:16:27Z
dc.date.available2021-09-29T13:16:27Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/867
dc.sourceIIOimport
dc.titleStatus of NODITO project
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage11
dc.source.endpage18
dc.source.conferenceNoise and Reliability of Semiconductor Devices. Proceedings of the International NODITO Workshop
dc.source.conferencedate18/07/1995
dc.source.conferencelocationBrno Czech Republic
imec.availabilityPublished - open access


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