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Technological challenges of advanced MOS processing and their impact on design aspects

dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T12:53:05Z
dc.date.available2021-10-15T12:53:05Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8690
dc.sourceIIOimport
dc.titleTechnological challenges of advanced MOS processing and their impact on design aspects
dc.typeProceedings paper
dc.source.peerreviewyes
dc.source.beginpage275
dc.source.endpage285
dc.source.conferenceProceedings 17th International Conference on VLSI Design
dc.source.conferencedate5/01/2004
dc.source.conferencelocationMumbai India
imec.availabilityPublished - imec


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