Show simple item record

Shift and ratio method revisited: extraction of fin width in multi-gate devices

dc.contributor.authorCollaert, Nadine
dc.contributor.authorDixit, Abhisek
dc.contributor.authorKottantharayil, Anil
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVeloso, Anabela
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-15T12:55:01Z
dc.date.available2021-10-15T12:55:01Z
dc.date.issued2004-03
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8707
dc.sourceIIOimport
dc.titleShift and ratio method revisited: extraction of fin width in multi-gate devices
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewno
dc.source.beginpage105
dc.source.endpage108
dc.source.conferenceProceedings Ultimate Integration of Silicon (ULIS) Workshop
dc.source.conferencedate11/03/2004
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record