Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Presentations
Experimental analysis of a Ge-HfO2-TaN gate stack with a large amount of interface states
Publication:
Experimental analysis of a Ge-HfO2-TaN gate stack with a large amount of interface states
Date
2004
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Croon, Jeroen
;
Kaczer, Ben
;
Lujan, Guilherme
;
Kubicek, Stefan
;
Groeseneken, Guido
;
Meuris, Marc
Journal
Abstract
Description
Metrics
Views
1965
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1965
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations