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dc.contributor.authorDaenen, Tom
dc.contributor.authorThijs, Steven
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorDe Heyn, Vincent
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-15T12:59:32Z
dc.date.available2021-10-15T12:59:32Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8744
dc.sourceIIOimport
dc.titleMultilevel transmission line pulse (MTLP) tester
dc.typeProceedings paper
dc.contributor.imecauthorDaenen, Tom
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorDe Heyn, Vincent
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.source.peerreviewno
dc.source.beginpage5.A.2
dc.source.conferenceElectrical Overstress / Electrostatic Discharge Symposium Proceedings
dc.source.conferencedate19/09/2004
dc.source.conferencelocationDallas, TX USA
imec.availabilityPublished - imec
imec.internalnotesCD-ROM proceedings


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