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Modified AIC and MDL model selection criteria for short data records

dc.contributor.authorDe Ridder, F.
dc.contributor.authorPintelon, R.
dc.contributor.authorSchoukens, J.
dc.contributor.authorGilikin, D.P.
dc.date.accessioned2021-10-15T13:06:41Z
dc.date.available2021-10-15T13:06:41Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8793
dc.sourceIIOimport
dc.titleModified AIC and MDL model selection criteria for short data records
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.beginpage1713
dc.source.endpage1717
dc.source.conferenceProceedings of the 21st IEEE Instrumentation and Measurement Technology Conference
dc.source.conferencedate18/05/2004
dc.source.conferencelocationComo Italy
imec.availabilityPublished - imec


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