dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Schuler, Franz | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Lorenzini, Martino | |
dc.contributor.author | Wellekens, Dirk | |
dc.contributor.author | Hendrickx, Paul | |
dc.contributor.author | Van Duuren, Michiel | |
dc.contributor.author | Dormans, G.J.M. | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Haspeslagh, Luc | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Tempel, Georg | |
dc.date.accessioned | 2021-10-15T13:10:27Z | |
dc.date.available | 2021-10-15T13:10:27Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8819 | |
dc.source | IIOimport | |
dc.title | Analytical percolation model for predicting anomalous charge loss in flash memories | |
dc.type | Journal article | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Wellekens, Dirk | |
dc.contributor.imecauthor | Hendrickx, Paul | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | Haspeslagh, Luc | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1392 | |
dc.source.endpage | 1400 | |
dc.source.journal | IEEE Trans. Electron Devices | |
dc.source.issue | 9 | |
dc.source.volume | 51 | |
imec.availability | Published - imec | |