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dc.contributor.authorDegraeve, Robin
dc.contributor.authorSchuler, Franz
dc.contributor.authorKaczer, Ben
dc.contributor.authorLorenzini, Martino
dc.contributor.authorWellekens, Dirk
dc.contributor.authorHendrickx, Paul
dc.contributor.authorVan Duuren, Michiel
dc.contributor.authorDormans, G.J.M.
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorTempel, Georg
dc.date.accessioned2021-10-15T13:10:27Z
dc.date.available2021-10-15T13:10:27Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8819
dc.sourceIIOimport
dc.titleAnalytical percolation model for predicting anomalous charge loss in flash memories
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorHendrickx, Paul
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage1392
dc.source.endpage1400
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue9
dc.source.volume51
imec.availabilityPublished - imec


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