Analytical percolation model for predicting anomalous charge loss in flash memories

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Authors

Degraeve, Robin; Schuler, Franz; Kaczer, Ben; Lorenzini, Martino; Wellekens, Dirk; Hendrickx, Paul; Van Duuren, Michiel; Dormans, G.J.M.; Van Houdt, Jan; Haspeslagh, Luc; Groeseneken, Guido; Tempel, Georg

Issue

9

Journal

IEEE Trans. Electron Devices

Volume

51

Title

Analytical percolation model for predicting anomalous charge loss in flash memories

Publication type

Journal article

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