Analytical percolation model for predicting anomalous charge loss in flash memories

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Author(s)

Degraeve, Robin

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Lorenzini, Martino

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Wellekens, Dirk

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Hendrickx, Paul

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Van Duuren, Michiel

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Dormans, G.J.M.

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Haspeslagh, Luc

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Groeseneken, Guido

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Journal

IEEE Trans. Electron Devices

Metrics

1922 since deposited on 2021-10-15

Acq. date: 2025-10-23