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Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method

dc.contributor.authorDeGroot, D.C.
dc.contributor.authorRolain, Y.
dc.contributor.authorPintelon, R.
dc.contributor.authorSchoukens, J.
dc.date.accessioned2021-10-15T13:10:36Z
dc.date.available2021-10-15T13:10:36Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8820
dc.sourceIIOimport
dc.titleCorrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.beginpage1735
dc.source.endpage1738
dc.source.conferenceIEEE MTT International Microwave Symposium Digest
dc.source.conferencedate6/06/2004
dc.source.conferencelocationFort Worth, TX USA
imec.availabilityPublished - imec


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