dc.contributor.author | Degryse, Dominiek | |
dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-15T13:11:01Z | |
dc.date.available | 2021-10-15T13:11:01Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8823 | |
dc.source | IIOimport | |
dc.title | FEM study of deformation and stresses in copper wire bonds on Cu lowK structures during processing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | no | |
dc.source.beginpage | 906 | |
dc.source.endpage | 912 | |
dc.source.conference | Proceedings 54th Electronic Components and Technology Conference | |
dc.source.conferencedate | 1/06/2004 | |
dc.source.conferencelocation | Las Vegas, NV USA | |
imec.availability | Published - imec | |