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Methodology to assess the reliability behavior of RF MEMS
Publication:
Methodology to assess the reliability behavior of RF MEMS
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dubuc, D.
;
van Spengen, Merlijn
;
Melle, S.
;
De Wolf, Ingrid
;
Mertens, Robert
;
Pons, P.
;
Grenier, K.
;
Plana, R.
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1822
since deposited on 2021-10-15
1
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Acq. date: 2025-12-10
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Metrics
Views
1822
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-10
Citations