Show simple item record

High resolution electrical characterization of advanced CMOS devices

dc.contributor.authorEyben, Pierre
dc.contributor.authorPetry, Jasmine
dc.contributor.authorJanssens, Tom
dc.contributor.authorFukutome, H.
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-15T13:23:28Z
dc.date.available2021-10-15T13:23:28Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8897
dc.sourceIIOimport
dc.titleHigh resolution electrical characterization of advanced CMOS devices
dc.typeProceedings paper
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewno
dc.source.beginpageS4-3-76
dc.source.conferenceSeeing at the Nanoscale II
dc.source.conferencedate13/10/2004
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec
imec.internalnotesCD-ROM proceedings


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record