Show simple item record

Minimizing the Size of Force-Controlled Point-Contacts on Silicon for Carrier Profiling

dc.contributor.authorSnauwaerts, Jan
dc.contributor.authorBlanc, N.
dc.contributor.authorDe Wolf, Peter
dc.contributor.authorHellemans, L.
dc.date.accessioned2021-09-29T13:17:07Z
dc.date.available2021-09-29T13:17:07Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/893
dc.sourceIIOimport
dc.titleMinimizing the Size of Force-Controlled Point-Contacts on Silicon for Carrier Profiling
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conference8th International Conference on Scanning Tunneling Microscopy / Spectroscopy and Related Techniques; 1995;
dc.source.conferencelocation
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record