Authors

Groeseneken, Guido; Pantisano, Luigi; Ragnarsson, Lars-Ake; Degraeve, Robin; Houssa, Michel; Kauerauf, Thomas; Roussel, Philippe; De Gendt, Stefan; Heyns, Marc

Conference

Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

Title

Achievements and challenges for the electrical performance of MOSFETs with high-k gate dielectrics

Publication type

Proceedings paper