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Linear kink effect induced drain current hysteresis in ultra thin gate oxide FD-SOI MOSFETs

dc.contributor.authorHayama, K.
dc.contributor.authorOhyama, H.
dc.contributor.authorRafi, Joan Marc
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T13:42:51Z
dc.date.available2021-10-15T13:42:51Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8999
dc.sourceIIOimport
dc.titleLinear kink effect induced drain current hysteresis in ultra thin gate oxide FD-SOI MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage59
dc.source.endpage62
dc.source.conferenceProceedings European Workshop on Ultimate Integration of Silicon - ULIS
dc.source.conferencedate11/03/2004
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - open access


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