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Anomalous threshold voltage change by 2 MeV electron irradiation at 100°C in deep submicron metal-oxide-semiconductor field-effect transistors
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Authors
Hayama, K.
;
Ohyama, H.
;
Simoen, Eddy
;
Rafi, Joan Marc
;
Mercha, Abdelkarim
;
Claeys, Cor
Journal
Applied Physics Letters
Volume
84
Title
Anomalous threshold voltage change by 2 MeV electron irradiation at 100°C in deep submicron metal-oxide-semiconductor field-effect transistors
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Journal article
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