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Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation
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Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hayama, K.
;
Takakura, K.
;
Ohyama, H.
;
Mercha, Abdelkarim
;
Simoen, Eddy
;
Claeys, Cor
;
Rafi, J.M.
;
Kokkoris, M.
Journal
Microelectronics Reliability
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2003
since deposited on 2021-10-15
Acq. date: 2026-01-09
Citations
Metrics
Views
2003
since deposited on 2021-10-15
Acq. date: 2026-01-09
Citations