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Saturation effects in TXRF on micro-droplet residues

dc.contributor.authorHellin, David
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorMertens, Paul
dc.contributor.authorVinckier, Chris
dc.date.accessioned2021-10-15T13:45:33Z
dc.date.available2021-10-15T13:45:33Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9012
dc.sourceIIOimport
dc.titleSaturation effects in TXRF on micro-droplet residues
dc.typeOral presentation
dc.contributor.imecauthorHellin, David
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorMertens, Paul
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.source.peerreviewno
dc.source.conferenceEuropean Conference on X-Ray Spectrometry
dc.source.conferencedate6/06/2004
dc.source.conferencelocationAlghero Italy
imec.availabilityPublished - imec


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