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Charge trapping in SiO2/HfO2 gate dielctrics: comparison between charge-pumping and pulsed I-D-V-G
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1859 since deposited on 2021-10-15
Acq. date: 2025-10-23
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Views
1859 since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations