Authors

Kerber, A.; Cartier, E.; Pantisano, Luigi; Degraeve, Robin; Groeseneken, Guido; Maes, Herman; Schwalke, U.

Issue

1_4

Journal

Microelectronic Engineering

Volume

72

Title

Charge trapping in SiO2/HfO2 gate dielctrics: comparison between charge-pumping and pulsed I-D-V-G

Publication type

Journal article