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dc.contributor.authorCriel, Steven
dc.contributor.authorMartens, Luc
dc.contributor.authorDe Zutter, Daniel
dc.date.accessioned2021-09-29T12:40:17Z
dc.date.available2021-09-29T12:40:17Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/91
dc.sourceIIOimport
dc.titleEvaluation of a New Measurement Set-up for the Accurate Characterisation of the Near-Field Radiated Emission of Printed Circuit Boards
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.contributor.imecauthorDe Zutter, Daniel
dc.source.peerreviewno
dc.source.beginpage51
dc.source.endpage53
dc.source.conferenceProceedings of the IEEE 3rd Topical Meeting of Electrical Performance of Electronic Packaging
dc.source.conferencedate2/11/1994
dc.source.conferencelocationMonterey, CA USA
imec.availabilityPublished - imec


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