Evaluation of a New Measurement Set-up for the Accurate Characterisation of the Near-Field Radiated Emission of Printed Circuit Boards
dc.contributor.author | Criel, Steven | |
dc.contributor.author | Martens, Luc | |
dc.contributor.author | De Zutter, Daniel | |
dc.date.accessioned | 2021-09-29T12:40:17Z | |
dc.date.available | 2021-09-29T12:40:17Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/91 | |
dc.source | IIOimport | |
dc.title | Evaluation of a New Measurement Set-up for the Accurate Characterisation of the Near-Field Radiated Emission of Printed Circuit Boards | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Martens, Luc | |
dc.contributor.imecauthor | De Zutter, Daniel | |
dc.source.peerreview | no | |
dc.source.beginpage | 51 | |
dc.source.endpage | 53 | |
dc.source.conference | Proceedings of the IEEE 3rd Topical Meeting of Electrical Performance of Electronic Packaging | |
dc.source.conferencedate | 2/11/1994 | |
dc.source.conferencelocation | Monterey, CA USA | |
imec.availability | Published - imec |
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