dc.contributor.author | Loo, Roger | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Verheyen, Peter | |
dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Delhougne, Romain | |
dc.contributor.author | De Meyer, Kristin | |
dc.date.accessioned | 2021-10-15T14:32:50Z | |
dc.date.available | 2021-10-15T14:32:50Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9221 | |
dc.source | IIOimport | |
dc.title | Fabrication of 50nm high performance strained-SiGe pMOSFETs with selective epitaxial growth | |
dc.type | Journal article | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Verheyen, Peter | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Delhougne, Romain | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.source.peerreview | no | |
dc.source.beginpage | 292 | |
dc.source.endpage | 296 | |
dc.source.journal | Applied Surface Science | |
dc.source.issue | 1_4 | |
dc.source.volume | 224 | |
imec.availability | Published - imec | |