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Black-gate induced noise overshoot in partially-depleted SOI MOSFETs
Publication:
Black-gate induced noise overshoot in partially-depleted SOI MOSFETs
Date
2004
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N.
;
Garbar, N.
;
Smolanka, A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
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1946
since deposited on 2021-10-15
406
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1946
since deposited on 2021-10-15
406
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations