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Black-gate induced noise overshoot in partially-depleted SOI MOSFETs
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Authors
Lukyanchikova, N.
;
Garbar, N.
;
Smolanka, A.
;
Simoen, Eddy
;
Claeys, Cor
Conference
Science and Technology of Semiconductor-on-Insulator Structures and Devices Operating in a Harsh Environment
Title
Black-gate induced noise overshoot in partially-depleted SOI MOSFETs
Publication type
Oral presentation
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