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Temperature influence on the generation lifetime determination based on drain current transients in partially depleted SOI nMOSFETs
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Temperature influence on the generation lifetime determination based on drain current transients in partially depleted SOI nMOSFETs
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martino, J.A.
;
Rafi, Joan Marc
;
Mercha, Abdelkarim
;
Simoen, Eddy
;
Claeys, Cor
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1870
since deposited on 2021-10-15
Acq. date: 2025-12-18
Citations
Metrics
Views
1870
since deposited on 2021-10-15
Acq. date: 2025-12-18
Citations