Authors

Nakabayashi, M.; Ohyama, H.; Hanano, N.; Hirao, T.; Simoen, Eddy; Claeys, Cor

Conference

Proceedings International Workshop on Radiation Effects in Semiconductor Devices for Space Applications

Title

The degradation of the electrical properties of IGBTS by 2-MeV electron irradiation and high-temperature

Publication type

Proceedings paper