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A study on radiation damage of IGBTs 2-MeV electrons at different temperatures

dc.contributor.authorNakabayashi, M.
dc.contributor.authorOhyama, H.
dc.contributor.authorHanano, N.
dc.contributor.authorKamiya, T.
dc.contributor.authorHirao, T.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T15:03:08Z
dc.date.available2021-10-15T15:03:08Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9338
dc.sourceIIOimport
dc.titleA study on radiation damage of IGBTs 2-MeV electrons at different temperatures
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage433
dc.source.endpage437
dc.source.conferenceProceedings 7th European Conference on Radiation and its Effects on Components and Systems
dc.source.conferencedate15/09/2003
dc.source.conferencelocationNoordwijk The Netherlands
imec.availabilityPublished - imec
imec.internalnotesESA SP-536


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