Study of electron-irradiated IGBTs by the DCIV method and lifetime
dc.contributor.author | Nakabayashi, M. | |
dc.contributor.author | Ohyama, H. | |
dc.contributor.author | Nanao, N. | |
dc.contributor.author | Hirao, T. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-15T15:03:40Z | |
dc.date.available | 2021-10-15T15:03:40Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9340 | |
dc.source | IIOimport | |
dc.title | Study of electron-irradiated IGBTs by the DCIV method and lifetime | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.beginpage | 632 | |
dc.source.endpage | 635 | |
dc.source.conference | Proceedings International Conference on Electrical Engineering | |
dc.source.conferencelocation | ||
imec.availability | Published - imec |
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