dc.contributor.author | Ohyama, H. | |
dc.contributor.author | Takakura, K. | |
dc.contributor.author | Watanabe, T. | |
dc.contributor.author | Nakabayashi, M. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-15T15:08:36Z | |
dc.date.available | 2021-10-15T15:08:36Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9358 | |
dc.source | IIOimport | |
dc.title | Radiation damages of SiC Schottky diodes by electron irradiation | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.conference | 5th International Conference Materials for Microelectronics and Nanoengineering (MFMN) | |
dc.source.conferencedate | 13/09/2004 | |
dc.source.conferencelocation | Southampton United Kingdom | |
imec.availability | Published - imec | |