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Electromagnetic field measurements in multi-path exposure conditions

dc.contributor.authorOlivier, Christof
dc.contributor.authorMartens, Luc
dc.date.accessioned2021-10-15T15:09:42Z
dc.date.available2021-10-15T15:09:42Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9362
dc.sourceIIOimport
dc.titleElectromagnetic field measurements in multi-path exposure conditions
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.source.peerreviewno
dc.source.conferenceInternational NIR Workshop & Symposium
dc.source.conferencedate20/05/2004
dc.source.conferencelocationSeville Spain
imec.availabilityPublished - imec
imec.internalnotespublished on CD-ROM, ISBN 3-93499404-0


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