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dc.contributor.authorPawlak, Bartek
dc.contributor.authorLindsay, Richard
dc.contributor.authorSurdeanu, Radu
dc.contributor.authorDieu, Bjorn
dc.contributor.authorGeenen, Luc
dc.contributor.authorHoflijk, Ilse
dc.contributor.authorRichard, Olivier
dc.contributor.authorDuffy, Ray
dc.contributor.authorClarysse, Trudo
dc.contributor.authorBrijs, Bert
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-15T15:22:30Z
dc.date.available2021-10-15T15:22:30Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9410
dc.sourceIIOimport
dc.titleChemical and electrical dopants profile evolution during solid phase epitaxial regrowth
dc.typeJournal article
dc.contributor.imecauthorPawlak, Bartek
dc.contributor.imecauthorHoflijk, Ilse
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.source.peerreviewno
dc.source.beginpage297
dc.source.endpage301
dc.source.journalJournal of Vacuum Science and Technology B
dc.source.issue1
dc.source.volume22
imec.availabilityPublished - imec


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