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Creating spectrally pure signals for ADC-testing

dc.contributor.authorRabijns, D.
dc.contributor.authorVan Moer, W.
dc.contributor.authorVandersteen, Gerd
dc.date.accessioned2021-10-15T15:42:04Z
dc.date.available2021-10-15T15:42:04Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9483
dc.sourceIIOimport
dc.titleCreating spectrally pure signals for ADC-testing
dc.typeMeeting abstract
dc.contributor.imecauthorVandersteen, Gerd
dc.source.peerreviewno
dc.source.conference23rd Benelux Meeting on Systems and Control
dc.source.conferencedate17/03/2004
dc.source.conferencelocationHelvoirt The Netherlands
imec.availabilityPublished - imec


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