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Experimental assessment of quantum effects in the low-frequency noise and RTS of deep submicron MOSFETs

dc.contributor.authorSimoen, Eddy
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T16:15:48Z
dc.date.available2021-10-15T16:15:48Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9601
dc.sourceIIOimport
dc.titleExperimental assessment of quantum effects in the low-frequency noise and RTS of deep submicron MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage121
dc.source.endpage128
dc.source.conferenceAdvanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
dc.source.conferencedate14/08/2003
dc.source.conferencelocationBrno Czech Republic
imec.availabilityPublished - open access
imec.internalnotesNATO Science Series; Vol. 151


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